MIDAS deconvolution software
With the use of geometric deconvolution, the widening
effect seen in many of the AFM images can be reduced to give a more
accurate image. This site also includes some C and VisualBasic
programs that extract
information from file headers of image files.
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 Deconvo
- tip deconvolution program.
With help of this program you can estimate the shape
of
your cantilever tip from AFM image (using blind estimation algorithm),
approximate the true surface and obtain the certainty map of the image.
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The Scanning Probe
Image Processor, SPIP
An image processing program designed with focus on
characterization of SPM instruments and
accurate quantification of image structures. Other
instruments like interference microscopes,
profilers and scanning electron microscopes are also supported.
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SPM
Calibrator Pro - a system for calibrating scanning
probe microscopes
SPM Calibrator consists of a reference standard and
data
analysis software. Features and benefits: Statistical
report
- documents magnification and distortion for quality control.
Pitch table and graph - shows trend of individual values, helps you
adjust your SPM to reduce distortion. Plain text output files -
can be imported into third-party spreadsheet or plotting programs.
Automatic feature finder- quick (no need to count features). High
precision analysis process (Patented)
- get precise dimensions for both large and small scans using one
standard.
Graphical interface, on-line help, free technical support - easy to
learn
and use.
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Statscan
- height calibration program.
With help of this program and a calibration grating
you
can perform different calibration procedures and simple arithmetical
operations with scans.
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WSxM Scanning Probe Microscopy Software
Windows application for Data Acquisition and
Processing
in Scanning Probe Microscopy (SPM):
- Real time control based on Digital Signal Processor (DSP)
technology.
- 3D rendering, pseudocolor image representation, Fourier
and
roughness analysis, data smoothing, cross section profiles, and more
sophisticated
operations, including current vs voltage (I-V) curves normalization,
Current
Image Tunneling Specstroscopy (CITS) analysis, and grain detection.
- Compatible with most of the SPM commercial file formats:
Digital
Instruments, Topometrix, Park Instruments, Omicron.
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 3D Surface
View Software
- Interactive
3D
scientific visualization with real time rendering.
- Available as ActiveX ocx control, ActiveX exe server,
and
turnkey end user application.
- Aimed for R&D in the field of scanning microscopy (SPM,
AFM,
STM, SNOM, NSOM, etc.) as well as 3D Laser Beam measurement.
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