Instrumentation | Accessories | Software
|DME - Danish
Micro Engineering A/S
|JPK Instruments AG
Molecular Devices and Tools for Nanotechnology,
Agoura Hills, CA
Rochester Hills, MI
Imaging Systems GmbH,
|Omicron Vacuumphysik GmbH,
Metrology Group was formed through the merger of Digital
Instruments, Santa Barbara, CA and TM Microscopes, formerly
ThermoMicroscopes, Inc., Sunnyvale, CA Merged brands also include
Topometrix and Park Scientific Instruments.
SPM accessories include probe tips, calibration gratings,
software, sample preparation supplies, etc. Many of these items
are available from the SPM
listed above, but also from microscopy dealers and more specialized
suppliers. A few
of the specialized dealers are listed below as a courtesy.
Inclusion in this list does not constitute any recommendation or
warranty on behalf of any company listed. If you know of one that
is not listed,
Microscopy, Inc. (ASM)
ASM is an SPM services company that also is a dealer in used SPM equipment and provides SPM software, and supplies, including calibration gratings.
Maker of the ActivResonance Controller, which improves the performance of force microscopes, especially when working in liquid environment. The ability to control the character of the cantilever resonance leads to enhanced image contrast and reduced deformation of soft samples.
|Innovative Solutions Bulgaria (ISB-BudgetSensors)
"The products of ISB - BudgetSensors (TM) are high-quality silicon SPM probes that fit to all well-known and commercially used Atomic Force Microscopes. We are offering different SPM probe types for different measuring modes."
K-Tek International is the US dealer for MicroMesch supplies from Silicon-MDT.
MikroMasch supplies Ultrasharp SPM tips, calibration gratings and special micromechanical structures.
& Co. KG
"We are a small company that has become the world leading manufacturer of probes for scanning probe microscopy."
Lenting / Germany
"Customer-optimized High Density Carbon scanning probes (HDC) for Atomic Force Microscopy"
Novascan fabricates atomic force microscope probes and surfaces with specific chemistries, molecules, linkers and particles.
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Revised: October 30, 2005
Copyright © John W. Cross